XIPE: the X-ray imaging polarimetry explorer
2013-01-01 Soffitta, P; Barcons, X; Bellazzini, R; Braga, J; Costa, E; Fraser, Gw; Gburek, S; Huovelin, J; Matt, G; Pearce, M; Poutanen, J; Reglero, V; Santangelo, A; Sunyaev, Ra; Tagliaferri, G; Weisskopf, M; Aloisio, R; Amato, E; Attina, P; Axelsson, M; Baldini, L; Basso, S; Bianchi, S; Blasi, P; Bregeon, J; Brez, A; Bucciantini, N; Burderi, L; Burwitz, V; Casella, P; Churazov, E; Civitani, M; Covino, S; da Silva, Rmc; Cusumano, G; Dadina, M; D'Amico, F; De Rosa, A; Di Cosimo, S; Di Persio, G; Di Salvo, T; Dovciak, M; Elsner, R; Eyles, Cj; Fabian, Ac; Fabiani, S; Feng, H; Giarrusso, S; Goosmann, Rw; Grandi, P; Grosso, N; Israel, G; Jackson, M; Kaaret, P; Karas, V; Kuss, M; Lai, D; La Rosa, G; Larsson, J; Larsson, S; Latronico, L; Maggio, A; Maia, J; Marin, F; Massai, Mm; Mineo, T; Minuti, M; Moretti, E; Muleri, F; O'Dell, Sl; Pareschi, G; Peres, G; Pesce, M; Petrucci, Po; Pinchera, M; Porquet, D; Ramsey, B; Rea, N; Reale, F; Rodrigo, Jm; Rozanska, A; Rubini, A; Rudawy, P; Ryde, F; Salvati, M; de Santiago, Va; Sazonov, S; Sgro, C; Silver, E; Spandre, G; Spiga, D; Stella, L; Tamagawa, T; Tamborra, F; Tavecchio, F; Dias, Tt; van Adelsberg, M; Wu, K; Zane, S